• DocumentCode
    1142634
  • Title

    Testing by Feedback Shift Register

  • Author

    David, René

  • Author_Institution
    Laboratoire d´´Automatique de Grenoble, Institut National Polytechnique de Grenoble
  • Issue
    7
  • fYear
    1980
  • fDate
    7/1/1980 12:00:00 AM
  • Firstpage
    668
  • Lastpage
    673
  • Abstract
    A compact testing method called feedback shift register testing (FSR testing) is presented and its properties, concerning detection and diagnosis, are given. The new notion of distinction potential is introduced. The proposed method is shown to have the maximum resolution and the maximum distinction potential that can be found for an m-bit signature.
  • Keywords
    Compact testing; FSR testing; distinction potential; fault detection; fault distinction; feedback shift register; resolution; Cascading style sheets; Circuit faults; Circuit testing; Electrons; Feedback; Linear code; Logic testing; Notice of Violation; Sequential circuits; Shift registers; Compact testing; FSR testing; distinction potential; fault detection; fault distinction; feedback shift register; resolution;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1980.1675641
  • Filename
    1675641
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1142634