Title :
Detection of Single Intermittent Faults in Sequential Circuits
Author_Institution :
IBM Thomas J. Watson Research Center
fDate :
7/1/1980 12:00:00 AM
Abstract :
Testing for intermittent faults in digital circuits has been given significant attention in the past few years. However, very little theoretical work was done regarding their detection in sequential circuits.
Keywords :
Error latency; Markov chain; deterministic and random testing; input probability; intermittent fault; sequential circuit; state table; Circuit faults; Circuit testing; Digital circuits; Digital systems; Electrical fault detection; Electromagnetic interference; Fault detection; Sequential analysis; Sequential circuits; System testing; Error latency; Markov chain; deterministic and random testing; input probability; intermittent fault; sequential circuit; state table;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1980.1675642
