DocumentCode
1142643
Title
Detection of Single Intermittent Faults in Sequential Circuits
Author
Savir, Jacob
Author_Institution
IBM Thomas J. Watson Research Center
Issue
7
fYear
1980
fDate
7/1/1980 12:00:00 AM
Firstpage
673
Lastpage
678
Abstract
Testing for intermittent faults in digital circuits has been given significant attention in the past few years. However, very little theoretical work was done regarding their detection in sequential circuits.
Keywords
Error latency; Markov chain; deterministic and random testing; input probability; intermittent fault; sequential circuit; state table; Circuit faults; Circuit testing; Digital circuits; Digital systems; Electrical fault detection; Electromagnetic interference; Fault detection; Sequential analysis; Sequential circuits; System testing; Error latency; Markov chain; deterministic and random testing; input probability; intermittent fault; sequential circuit; state table;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1980.1675642
Filename
1675642
Link To Document