DocumentCode :
1142647
Title :
Source-pull measurements using reverse six-port reflectometers with application to MESFET mixer design
Author :
Lê, Di-Luân ; Ghannouchi, Fadhel M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada
Volume :
42
Issue :
9
fYear :
1994
fDate :
9/1/1994 12:00:00 AM
Firstpage :
1589
Lastpage :
1595
Abstract :
A new experimental technique using six-port reflectometers, operated in reverse configuration, suitable for source-pull device characterization is reported. Analytical analysis and experimental verification show that using the six-port in reverse configuration allows the impedance of the test port of the six-port junction to be measured. This measurement technique is suitable for the design of low noise amplifiers and of active nonlinear circuits such as FET mixers and power amplifiers. This measurement technique has been used for the first time to study: 1) The effect of the LO and RF impedances of the input matching circuit of a MESFET gate mixer on the LF output power and conversion gain. 2) The effect of the phase of a LO offset short circuit presented to the MESFET output on the DC power efficiency and the conversion gain of the gate mixer. Experimental results of a NE-72084 GaAs MESFET gate mixer demonstrate that by presenting to the MESFET the optimum input RF and LO impedances and the right phase for the LO offset short-circuit at the output, 2.5 dB conversion gain can be achieved with a 2.5 times reduction of DC power consumption as compared to conventional design approaches
Keywords :
Schottky gate field effect transistors; calibration; electronic equipment testing; measurement errors; microwave amplifiers; microwave reflectometry; mixers (circuits); power amplifiers; reflectometers; solid-state microwave circuits; 2.5 dB; DC power consumption; GaAs; LF output power; LO impedance; LO offset short circuit; MESFET mixer design; RF impedance; active nonlinear circuits; conversion gain; input matching circuit; low noise amplifiers; power amplifiers; reverse configuration; reverse six-port reflectometers; six-port junction; source-pull device characterization; source-pull measurements; Active noise reduction; Circuit noise; Circuit testing; Impedance measurement; Low-frequency noise; Low-noise amplifiers; MESFET circuits; Measurement techniques; Radio frequency; Radiofrequency amplifiers;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.310550
Filename :
310550
Link To Document :
بازگشت