Measurement of dielectrics at 100 GHz with an open resonator connected to a network analyzer

Author

Hirvonen, Taavi M. ; Vainikainen, Pertti ; Lozowski, Andrzej ; Räisänen, Antti V.

Author_Institution

Radio Lab., Helsinki Univ. of Technol., Espoo, Finland

Volume

45

Issue

4

fYear

1996

fDate

8/1/1996 12:00:00 AM

Firstpage

780

Lastpage

786

Abstract

A high-Q hemispherical open resonator is connected to an automatic network analyzer to enable precise and fast determination of the permittivity and loss tangent of low-loss dielectric materials at 100 GHz. Both scalar theory and vector theory with a frequency variation method are used to determine the dielectric properties of low-loss materials which are used in quasioptical components, for example in fusion reactor windows and tenses for millimeter-wave receivers. The uncertainty of the measurement is 0.02% to 0.04% for ε_r(ε_r⩾2) and 6-40×10^-6 for tan δ(10^-4⩽tan δ⩽10^-3)

Keywords

cavity resonators; millimetre wave measurement; network analysers; permittivity measurement; 100 GHz; automatic network analyzer; frequency variation method; fusion reactor windows; high-Q hemispherical open resonator; loss tangent; low-loss materials; millimeter-wave receivers; network analyzer; open resonator; permittivity; quasioptical components; scalar theory; vector theory; Dielectric losses; Dielectric materials; Dielectric measurements; Loss measurement; Millimeter wave measurements; Millimeter wave technology; Mirrors; Optical materials; Permittivity measurement; Resonance;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.516996

Filename

516996