Title :
Morphological transform for removal of exponentially decaying DC-offset
Author :
Lu, Z. ; Ji, T.Y. ; Wu, Q.H.
Author_Institution :
Dept. of Electr. Eng. & Electron., Univ. of Liverpool, Liverpool
Abstract :
Presented is a novel mathematical morphological transform to extract decaying DC offset components which are contained in fault currents.
Keywords :
fault currents; mathematical morphology; relay protection; DC-offset; exponential decay removal; fault currents; mathematical morphological transform;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20082501
