• DocumentCode
    1143147
  • Title

    A model for incorporating the effects of nonzero switching-time constants in electrooptic masks used in Hadamard-transform spectrometry

  • Author

    Xiong, Jize ; Dyer, Ruth A. ; Dyer, Stephen A.

  • Author_Institution
    Texas Instrum. Inc., Plano, TX, USA
  • Volume
    45
  • Issue
    4
  • fYear
    1996
  • fDate
    8/1/1996 12:00:00 AM
  • Firstpage
    800
  • Lastpage
    804
  • Abstract
    Hadamard-transform (HT) spectrometers offer a multiplex advantage over conventional monochromators, making them very useful in situations in which the signal-to-noise ratio is low. HT spectrometers having no moving parts can be implemented by substituting an electrooptic mask for the moving mask in the optical path. However, the physical properties of an electrooptic mask introduce two types of nonidealities-static and dynamic-into the measurement system. These nonidealities can cause distortions in the acquired spectra if their effects are neglected in the signal-recovery process. We have developed two complete system models that incorporate the effects of both static and dynamic nonidealities. In addition, we have devised recovery schemes applicable for each system model and have designed computationally efficient implementations of the recovery schemes
  • Keywords
    Hadamard transforms; electro-optical filters; image restoration; monochromators; spectrometer accessories; spectrometers; HT spectrometers; Hadamard-transform spectrometry; computationally efficient implementations; distortions; dynamic nonidealities; electrooptic masks; multiplex; nonzero switching-time constants; optical path; physical properties; signal-recovery; signal-to-noise ratio; static nonidealities; Distortion measurement; Energy measurement; Instruments; Optical distortion; Radiation detectors; Signal detection; Signal processing; Signal to noise ratio; Spectroscopy; Switches;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.516999
  • Filename
    516999