Title :
Spatio-temporal feature maps using gated neuronal architecture
Author :
Chandrasekaran, V. ; Palaniswami, M. ; Caelli, Terry M.
Author_Institution :
Dept. of Electr. & Electron. Eng., Melbourne Univ., Parkville, Vic., Australia
fDate :
9/1/1995 12:00:00 AM
Abstract :
In this paper, Kohonen´s self-organizing feature map is modified by a novel technique of allowing the neurons in the feature map to compete in a selective manner. The selective competition is achieved by grating the N-dimensional feature space using a spatial frequency and setting a criterion for the neurons to compete based on the region in which the input pattern resides. The spatial grating and selective competition are achieved by introducing a gated neuronal architecture in the feature map. As the selection criterion changes with time, it generates a time sequence of winning node indexes providing more input information and potentially allowing higher classification performance. These time sequences are then used to predict the class label of the input pattern more accurately. Three possible class label prediction algorithms are formulated based on evidential reasoning method and Bayes conditional probability theorem. These are tested on real world 8-class texture and a synthetic 12-class 3D object recognition problems. The classification performance is then compared with the results obtained by using a standard statistical linear discriminant analysis
Keywords :
Bayes methods; case-based reasoning; neural net architecture; object recognition; parallel architectures; pattern classification; probability; self-organising feature maps; 3D object recognition; Bayes conditional probability; Kohonen self-organizing feature map; N-dimensional feature space; evidential reasoning; gated neuronal architecture; pattern classification; selective competition; spatial frequency; spatio-temporal feature maps; time sequence; winning node indexes; Artificial neural networks; Frequency; Gratings; Information processing; Nervous system; Neurons; Object recognition; Prediction algorithms; Probability; Testing;
Journal_Title :
Neural Networks, IEEE Transactions on