DocumentCode
1143232
Title
Hierarchical Finite-Element Reduction-Recovery Method for Large-Scale Transient Analysis of High-Speed Integrated Circuits
Author
Gan, Houle ; Jiao, Dan
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume
33
Issue
1
fYear
2010
Firstpage
276
Lastpage
284
Abstract
This paper proposes a hierarchical finite-element reduction-recovery method for large-scale transient analysis of high-speed integrated circuits. This method rigorously reduces the matrix of a multilayer system of O(N) to that of a single-cell system of O(1) regardless of the original problem size. More important, the matrix reduction is achieved analytically, and hence the CPU and memory overheads are minimal. In addition, the reduction preserves the sparsity of the original system matrix. As a result, the matrix factorization cost is reduced to O(1) by the proposed method. The CPU cost at each time step scales linearly with the number of unknowns. The method is applicable to any Manhattan-type integrated circuit embedded in layered dielectric media. Numerical and experimental results demonstrate the performance of the proposed method.
Keywords
dielectric devices; finite element analysis; high-speed integrated circuits; matrix decomposition; transient analysis; CPU; Manhattan-type integrated circuit; hierarchical finite-element reduction-recovery method; high-speed integrated circuits; large-scale transient analysis; layered dielectric media; matrix factorization; matrix reduction; memory overheads; multilayer system; Electromagnetics; finite-element method; integrated circuits; large-scale analysis; time domain; transient analysis;
fLanguage
English
Journal_Title
Advanced Packaging, IEEE Transactions on
Publisher
ieee
ISSN
1521-3323
Type
jour
DOI
10.1109/TADVP.2009.2019844
Filename
5169997
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