DocumentCode :
1143249
Title :
Single-shot, repetitive, and lifetime high-voltage testing of capacitors
Author :
Shkuratov, Sergey I. ; Talantsev, Evgueni F. ; Hatfield, Lynn L. ; Dickens, James C. ; Kristiansen, Magne
Author_Institution :
Dept. of Electr. & Comput. Eng. & Phys., Texas Tech Univ., Lubbock, TX, USA
Volume :
30
Issue :
5
fYear :
2002
fDate :
10/1/2002 12:00:00 AM
Firstpage :
1943
Lastpage :
1949
Abstract :
Four different types of capacitors have been tested to determine the maximum usable high voltage. Ceramic, drop-dipped film, molded-mylar tubulars, and polyester/foil capacitors of different values and different nominal voltages were tested in four modes: the single-shot mode, the repetitive mode, the lifetime dc voltage mode, and the group mode. Experiments have shown that the breakdown voltage for all types of the capacitors tested is ten to seventeen times higher than the nominal voltage. The energy stored in the capacitors for a short time under overstress conditions is from 100 to 250 times higher their normal energy. Data are given for the limitations for single capacitors, and for two, three, and four capacitors connected in parallel.
Keywords :
ceramic capacitors; foils; high-voltage techniques; impulse testing; life testing; polymers; power capacitors; pulsed power supplies; thin film capacitors; breakdown voltage; capacitors testing; ceramic capacitors; drop-dipped film capacitors; energy storage; group mode; lifetime DC voltage mode; lifetime high-voltage testing; maximum usable high voltage; molded-mylar tubular capacitors; normal energy; overstress conditions; polyester/foil capacitors; repetitive testing; single-shot testing; thin-film capacitors; Capacitors; Ceramics; Current measurement; Electronic components; Life testing; Manufacturing; Probes; Resistors; System testing; Voltage;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2002.806628
Filename :
1178233
Link To Document :
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