Rensselaer heavy ion beam probe diagnostic methods and techniques

Author

Crowley, T.P.

Author_Institution

Dept. of Electr. Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA

Volume

22

Issue

4

fYear

1994

fDate

8/1/1994 12:00:00 AM

Firstpage

291

Lastpage

309

Abstract

The operating principles, measurement capabilities, hardware, and data analysis techniques of heavy ion beam probe diagnostics as used by the Rensselaer Plasma Dynamics Lab are reviewed. The topics that are addressed include; trajectory calculations of the ion beams; how the diagnostic measures plasma density, electron temperature, electric potential, and magnetic vector potential; the energy analyzer used to detect the beam, other hardware used in the experiments, and the basic techniques used in fluctuation studies and related diagnostic issues

Keywords

data analysis; density measurement; electric potential; ion beam applications; ion beam effects; ion beams; plasma density; plasma probes; plasma temperature; temperature measurement; Rensselaer Plasma Dynamics Lab; Rensselaer heavy ion beam probe diagnostic methods; data analysis; diagnostic methods and techniques; electric potential; electron temperature; energy analyzer; fluctuation; hardware; ion beams; magnetic vector potential; measurement capabilities; operating principles; plasma density; trajectory calculations; Data analysis; Density measurement; Energy measurement; Hardware; Ion beams; Plasma density; Plasma diagnostics; Plasma measurements; Plasma temperature; Probes;

fLanguage

English

Journal_Title

Plasma Science, IEEE Transactions on

Publisher

ieee

ISSN

0093-3813

Type

jour

DOI

10.1109/27.310636

Filename

310636