• DocumentCode
    1143538
  • Title

    Application of the Child-Langmuir law to magnetron discharge plasmas

  • Author

    Kuwahara, Kiyoshi ; Fujiyama, Hiroshi

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Nagasaki Univ., Japan
  • Volume
    22
  • Issue
    4
  • fYear
    1994
  • fDate
    8/1/1994 12:00:00 AM
  • Firstpage
    442
  • Lastpage
    448
  • Abstract
    In order to investigate the influence of magnetic field on magnetron plasmas, the dependence of discharge-current density (Jd ) on magnetic flux densities (B) perpendicular to the electric field over the whole discharge space in a magnetron apparatus with flat multi-targets has been studied. The dependencies on working gas pressures (P) and voltages (V) have been also studied in the configuration. From the experimental results, it was found that Jd was approximately proportional to B2, P2 and V3/2. The sheath structure in the apparatus has been investigated as a function of B by both a probe method and a spectroscopic one. The cathode-fall thickness was roughly proportional to B-1. From a numerical analysis on kinetics of γ electrons emitted from the cathode surface, it was found that the dependence of Jd on B could be explained by the Child-Langmuir law, in which the sheath thickness was replaced by the equivalent electron Larmor radius
  • Keywords
    Langmuir probes; discharges (electric); plasma density; plasma diagnostics; plasma sheaths; Child-Langmuir law; cathode surface; cathode-fall thickness; discharge-current density; electric field; electron Larmor radius; flat multi-targets; magnetic field; magnetic flux densities; magnetron discharge plasmas; numerical analysis; probe method; sheath structure; spectroscopic method; voltages; working gas pressures; Electron emission; Magnetic fields; Magnetic flux; Magnetic flux density; Numerical analysis; Plasma applications; Plasma density; Probes; Spectroscopy; Voltage;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.310653
  • Filename
    310653