Title :
Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits
Author :
Liaw, Chi-chang ; Su, Stephen Y H ; Malaiya, Yashwant K.
Author_Institution :
Research Group on Design Automation and Fault-Tolerant Computing, School of Advanced Technology, State University of New York
Abstract :
Practical solutions have not been obtained from the previous papers addressing the problem of testing intermittent faults in sequential circuits. Existing methods are only suitable for small sequential circuits. This correspondence presents a new technique to design test-experiments for intermittent faults which can conveniently be used for relatively more complex synchronous sequential circuits.
Keywords :
Dynamic programming; fault detection; fault diagnosis; fault location; integer programming; intermittent faults; ordering of test sequences; repetitive testing; sequential circuits; simulation; test experiments; transient faults; Circuit faults; Circuit simulation; Circuit testing; Clocks; Combinational circuits; Electrical fault detection; Fault detection; Linear programming; Sequential analysis; Sequential circuits; Dynamic programming; fault detection; fault diagnosis; fault location; integer programming; intermittent faults; ordering of test sequences; repetitive testing; sequential circuits; simulation; test experiments; transient faults;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1981.1675743
