Title :
Learning and feature selection in stereo matching
Author :
Lew, Michael S. ; Huang, Thomas S. ; Wong, Kam
Author_Institution :
Beckman Inst. for Adv. Sci. & Technol., Illinois Univ., Urbana, IL, USA
fDate :
9/1/1994 12:00:00 AM
Abstract :
We present a novel stereo matching algorithm which integrates learning, feature selection, and surface reconstruction. First, a new instance based learning (IBL) algorithm is used to generate an approximation to the optimal feature set for matching. In addition, the importance of two separate kinds of knowledge, image dependent knowledge and image independent knowledge, is discussed. Second, we develop an adaptive method for refining the feature set. This adaptive method analyzes the feature error to locate areas of the image that would lead to false matches. Then these areas are used to guide the search through feature space towards maximizing the class separation distance between the correct match and the false matches. Third, we introduce a self-diagnostic method for determining when apriori knowledge is necessary for finding the correct match. If the a priori knowledge is necessary then we use a surface reconstruction model to discriminate between match possibilities. Our algorithm is comprehensively tested against fixed feature set algorithms and against a traditional pyramid algorithm. Finally, we present and discuss extensive empirical results of our algorithm based on a large set of real images
Keywords :
adaptive systems; error analysis; feature extraction; image reconstruction; learning (artificial intelligence); stereo image processing; adaptive method; approximation; feature selection; feature set; feature space; image dependent knowledge; image independent knowledge; instance based learning; self-diagnostic method; stereo matching; surface reconstruction; surface reconstruction model; Approximation algorithms; Cameras; Error analysis; Image analysis; Image reconstruction; Image resolution; Stereo image processing; Surface reconstruction; Testing; USA Councils;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on