• DocumentCode
    1143753
  • Title

    Errata to "Comparison of charge yield in MOS devices for different radiation sources"

  • Author

    Paillet, P. ; Schwank, James R. ; Shaneyfelt, Marty R. ; Ferlet-Cavrois, Veronique ; Jones, R.L. ; Flament, O. ; Blackmore, Ewart W.

  • Author_Institution
    CEA/DIF
  • Volume
    50
  • Issue
    1
  • fYear
    2003
  • Firstpage
    226
  • Lastpage
    226
  • Abstract
    In the above-named article [ibid., vol. 49, pp. 2656??2661, Dec. 2002], an editorial processing error ocurred in the reproduction of Figs. 1 and 2. The correctly processed versions are given.
  • Keywords
    Laboratories; MOS devices; MOSFETs; Protons;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2003.809324
  • Filename
    1178714
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1143753