Title :
An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits
Author_Institution :
IBM General Technology Division
fDate :
3/1/1981 12:00:00 AM
Abstract :
The D-algorithm (DALG) is shown to be ineffective for the class of combinational logic circuits that is used to implement error correction and translation (ECAT) functions. PODEM (path-oriented decision making) is a new test generation algorithm for combinational logic circuits. PODEM uses an implicit enumeration approach analogous to that used for solving 0-1 integer programming problems. It is shown that PODEM is very efficient for ECAT circuits and is significantly more efficient than DALG over the general spectrum of combinational logic circuits. A distinctive feature of PODEM is its simplicity when compared to the D-algorithm. PODEM is a complete algorithm in that it will generate a test if one exists. Heuristics are used to achieve an efficient implicit search of the space of all possible primary input patterns until either a test is found or the space is exhausted.
Keywords :
Combinational logic; D-algorithm; decision tree; error correction; implicit enumeration; stuck faults; test generation; untestable fault; Circuit faults; Circuit testing; Combinational circuits; Decision making; Decision trees; Error correction; Linear programming; Logic circuits; Logic testing; System testing; Combinational logic; D-algorithm; decision tree; error correction; implicit enumeration; stuck faults; test generation; untestable fault;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1981.1675757