• DocumentCode
    1143774
  • Title

    An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits

  • Author

    Goel, Prabhakar

  • Author_Institution
    IBM General Technology Division
  • Issue
    3
  • fYear
    1981
  • fDate
    3/1/1981 12:00:00 AM
  • Firstpage
    215
  • Lastpage
    222
  • Abstract
    The D-algorithm (DALG) is shown to be ineffective for the class of combinational logic circuits that is used to implement error correction and translation (ECAT) functions. PODEM (path-oriented decision making) is a new test generation algorithm for combinational logic circuits. PODEM uses an implicit enumeration approach analogous to that used for solving 0-1 integer programming problems. It is shown that PODEM is very efficient for ECAT circuits and is significantly more efficient than DALG over the general spectrum of combinational logic circuits. A distinctive feature of PODEM is its simplicity when compared to the D-algorithm. PODEM is a complete algorithm in that it will generate a test if one exists. Heuristics are used to achieve an efficient implicit search of the space of all possible primary input patterns until either a test is found or the space is exhausted.
  • Keywords
    Combinational logic; D-algorithm; decision tree; error correction; implicit enumeration; stuck faults; test generation; untestable fault; Circuit faults; Circuit testing; Combinational circuits; Decision making; Decision trees; Error correction; Linear programming; Logic circuits; Logic testing; System testing; Combinational logic; D-algorithm; decision tree; error correction; implicit enumeration; stuck faults; test generation; untestable fault;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1981.1675757
  • Filename
    1675757