DocumentCode
1144013
Title
Marchand Balun Embedded Probe
Author
Jung, Kooho ; Campbell, Richard L. ; Hanaway, Peter ; Andrews, Michael F. ; McCuen, Carol ; Eisenstadt, William R. ; Fox, Robert M.
Author_Institution
Cascade Microtech Inc., Beaverton, OR
Volume
56
Issue
5
fYear
2008
fDate
5/1/2008 12:00:00 AM
Firstpage
1207
Lastpage
1214
Abstract
Planar-type Marchand baluns are embedded into on-wafer probes in order to provide accurate differential measurement capabilities for conventional single-ended measurement equipments such as the two-port vector network analyzer. In designing the planar-type Marchand balun, the values for differential- and common-mode characteristic impedances of the coupled transmission lines are analytically derived by using general transmission line theories. The derived characteristic impedances are realized using a double-sided single-layer printed circuit board surrounded by conductive fixtures. The proposed coupled transmission line structure provides convenient port interfaces to the coaxial cables and it is free from bond wires and vias, enabling one to achieve high cost efficiency and reproducibility.
Keywords
baluns; coupled transmission lines; printed circuits; probes; balun embedded probe; bond wires; coaxial cables; coupled transmission lines; differential measurement capabilities; double-sided single-layer printed circuit board; on-wafer probes; planar-type Marchand baluns; single-ended measurement equipments; two-port vector network analyzer; Coupled transmission lines; Marchand balun; differential measurement; on-wafer probe; planar balun;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2008.921702
Filename
4497828
Link To Document