• DocumentCode
    1144013
  • Title

    Marchand Balun Embedded Probe

  • Author

    Jung, Kooho ; Campbell, Richard L. ; Hanaway, Peter ; Andrews, Michael F. ; McCuen, Carol ; Eisenstadt, William R. ; Fox, Robert M.

  • Author_Institution
    Cascade Microtech Inc., Beaverton, OR
  • Volume
    56
  • Issue
    5
  • fYear
    2008
  • fDate
    5/1/2008 12:00:00 AM
  • Firstpage
    1207
  • Lastpage
    1214
  • Abstract
    Planar-type Marchand baluns are embedded into on-wafer probes in order to provide accurate differential measurement capabilities for conventional single-ended measurement equipments such as the two-port vector network analyzer. In designing the planar-type Marchand balun, the values for differential- and common-mode characteristic impedances of the coupled transmission lines are analytically derived by using general transmission line theories. The derived characteristic impedances are realized using a double-sided single-layer printed circuit board surrounded by conductive fixtures. The proposed coupled transmission line structure provides convenient port interfaces to the coaxial cables and it is free from bond wires and vias, enabling one to achieve high cost efficiency and reproducibility.
  • Keywords
    baluns; coupled transmission lines; printed circuits; probes; balun embedded probe; bond wires; coaxial cables; coupled transmission lines; differential measurement capabilities; double-sided single-layer printed circuit board; on-wafer probes; planar-type Marchand baluns; single-ended measurement equipments; two-port vector network analyzer; Coupled transmission lines; Marchand balun; differential measurement; on-wafer probe; planar balun;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2008.921702
  • Filename
    4497828