Title :
Millimeter-wave monolithic integrated circuit characterization by a picosecond optoelectronic technique
Author :
Hung, Hing-Loi A. ; Polak-Dingels, Penny ; Webb, Kevin J. ; Smith, Thane ; Huang, Ho C. ; Lee, Chi H.
Author_Institution :
COMSAT Labs., Clarksburg, MD, USA
fDate :
8/1/1989 12:00:00 AM
Abstract :
The characterization of microwave and millimeter-wave monolithic integrated circuits (MIMICs) using picosecond pulse-sampling techniques is developed with emphasis on improving broadband coverage and measurement accuracy. GaAs photoconductive switches are used for signal generation and sampling operations. The measured time-domain response allows the spectral transfer function of the MIMIC to be obtained. This measurement technique is verified by characterization of the frequency response (magnitude and phase) of a reference 50-Ω microstrip line and a two-stage Ka-band MIMIC amplifier. The measured broadband results agree with those obtained from conventional frequency-domain measurements using a network analyzer. The application of this optical technique to on-wafer MIMIC characterization is described
Keywords :
MMIC; frequency response; integrated circuit testing; microwave amplifiers; microwave measurement; GaAs photoconductive switches; Ka-band; MIMICs; broadband coverage; frequency response; frequency-domain measurements; measurement accuracy; microstrip line; millimeter-wave monolithic integrated circuits; picosecond optoelectronic technique; pulse-sampling techniques; sampling operations; signal generation; spectral transfer function; time-domain response; Frequency measurement; Gallium arsenide; Integrated circuit measurements; MIMICs; Microwave measurements; Microwave theory and techniques; Millimeter wave measurements; Photoconductivity; Pulse circuits; Pulse measurements;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
