DocumentCode
1144788
Title
Guest Editors´ Comments
Author
Butler, J.T. ; Wojcik, A.S.
Issue
9
fYear
1981
Firstpage
617
Lastpage
618
Abstract
MULTIPLE-VALUED logic has been the subject of considerable study during the past decade [1]-[3]. Indeed, there has been an annual symposium devoted exclusively to the subject since 1971. The Proceedings of these annual symposia provide a historical perspective to the developments in multiple-valued logic. Initially, researchers were most concerned with such problems as the determination of functionally complete sets of logical operators, functional minimization, and other switching theoretic and logical design problems. Only a few worked on the implementation of multiple-valued logic circuits [4], [5]. Another problem, which still exists, is functional representation. While the truth table for a 10 input m-valued function is inconveniently large for m = 2, it is intractably large for m > 2; and algebraic expressions for even relatively simple multiple-valued functions are typically quite complex.
Keywords
Charge coupled devices; Circuit testing; Computer aided manufacturing; Fuzzy logic; Integrated circuit interconnections; Logic circuits; Logic devices; Logic testing; Read only memory; Very large scale integration;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1981.1675859
Filename
1675859
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