• DocumentCode
    1144795
  • Title

    The Prospects for Multivalued Logic: A Technology and Applications View

  • Author

    Smith, K.C.

  • Author_Institution
    Departments of Electrical Engineering and Computer Sciences, University of Toronto
  • Issue
    9
  • fYear
    1981
  • Firstpage
    619
  • Lastpage
    634
  • Abstract
    Advances in multiple-valued logic (MVL) have been inspired, in large part, by advances in integrated circuit technology. Multiple-valued logic has matured to the point where four-valued logic is now part of commercially available VLSI IC´s. Besides reduction in chip area, MVL offers other benefits such as the potential for circuit test. This paper describes the historical and technical background of MVL, and areas of present and future application. It is intended, as well, to serve as a tutorial for the nonspecialist.
  • Keywords
    Arithmetic; VLSI; fault detection; logic circuits; multivalued logic; signal processing; Circuit testing; Cost function; Digital systems; Electrical fault detection; Integrated circuit interconnections; Integrated circuit technology; Logic circuits; Multivalued logic; Signal processing; Very large scale integration; Arithmetic; VLSI; fault detection; logic circuits; multivalued logic; signal processing;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1981.1675860
  • Filename
    1675860