Title :
Design for Testability—A Survey
Author :
Williams, T.W. ; Parker, Kenneth P.
Author_Institution :
General Technology Division, IBM
Abstract :
This paper discusses the basics of design for testability. A short review of testing is given along with some reasons why one should test. The different techniques of design for testability are discussed in detail. These include techniques which can be applied to today´s technologies and techniques which have been recently introduced and will soon appear in new designs.
Keywords :
Built-In Logic Block Observation (BILBO); Level Sensitive Scan Design (LSSD); Random Access Scan; Scan Path; Scan/Set Logic; Signature Analysis; self test; test generation; testing; Controllability; Costs; Design for testability; Linear feedback shift registers; Logic design; Logic devices; Logic gates; Logic testing; Manufacturing; Observability; Built-In Logic Block Observation (BILBO); Level Sensitive Scan Design (LSSD); Random Access Scan; Scan Path; Scan/Set Logic; Signature Analysis; self test; test generation; testing;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1982.1675879
