DocumentCode :
1145013
Title :
Achieving accurate thermal characterization using a CFD code-case study of plastic packages
Author :
Burgos, Juan ; Manno, Vincent P. ; Azar, Kaveh
Author_Institution :
Dept. of Mech. Eng., Tufts Univ., Medford, MA, USA
Volume :
18
Issue :
4
fYear :
1995
fDate :
12/1/1995 12:00:00 AM
Firstpage :
732
Lastpage :
738
Abstract :
Achieving component-level thermal characterization using computational fluid dynamics (CFD) is assessed using a case study approach. A commercial CFD code (FLOTHERM) is used to simulate the thermal performance of three plastic-based microelectronic packages (68-lead and 84-lead plastic leaded chip carriers or PLCC´s, and a 164-lead plastic quad flat pack or PQFP) under forced air cooling conditions. Predictions of junction-to-ambient thermal resistance (θja) are compared to experimental measurements. One aspect of the work is to use results from a single situation (84-PLCC and an approach air velocity of 1.52 m/s) to develop a set of “modeling guidelines”. These modeling guidelines are then applied to the other components (68-PLCC and 164-PQFP) and flow conditions (0.7-3.05 m/s) to test their validity. Guideline parameters include near component flow field nodalization, geometric detail in representing conduction paths and code user options such as turbulent flow models. The average deviation of predicted versus measured values of θja was 7.5% using the derived guidelines. An additional component design sensitivity investigated was the effect of the introduction of a heat spreading “heat post” in the high temperature regions of the 164-PQFP,
Keywords :
circuit CAD; cooling; forced convection; integrated circuit design; integrated circuit packaging; plastic packaging; thermal analysis; thermal resistance; 0.76 to 3.05 m/s; CFD code; FLOTHERM; PLCC; PQFP; approach air velocity; computational fluid dynamics; conduction paths; forced air cooling conditions; heat spreading; junction-to-ambient thermal resistance; microelectronic packages; near component flow field nodalization; plastic leaded chip carriers; plastic packages; plastic quad flat pack; thermal characterization; turbulent flow models; Computational fluid dynamics; Computational modeling; Cooling; Electrical resistance measurement; Electronics packaging; Guidelines; Microelectronics; Plastic packaging; Thermal force; Thermal resistance;
fLanguage :
English
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9886
Type :
jour
DOI :
10.1109/95.477458
Filename :
477458
Link To Document :
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