Title :
A capacitance-compensation technique for improved linearity in CMOS class-AB power amplifiers
Author :
Wang, Chengzhou ; Vaidyanathan, Mani ; Larson, Lawrence E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of California, La Jolla, CA, USA
Abstract :
A nonlinear capacitance-compensation technique is developed to help improve the linearity of CMOS class-AB power amplifiers. The method involves placing a PMOS device alongside the NMOS device that works as the amplifying unit, such that the overall capacitance seen at the amplifier input is a constant, thus improving linearity. The technique is developed with the help of computer simulations and Volterra analysis. A prototype two-stage amplifier employing the scheme is fabricated using a 0.5-μm CMOS process, and the measurements show that an improvement of approximately 8 dB in both two-tone intermodulation distortion (IM3) and adjacent-channel leakage power (ACP1) is obtained for a wide range of output power. The linearized amplifier exhibits an ACP1 of -35 dBc at the designed output power of 24 dBm, with a power-added efficiency of 29% and a gain of 23.9 dB, demonstrating the potential utility of the design approach for 3GPP WCDMA applications.
Keywords :
CMOS integrated circuits; Volterra series; adjacent channel interference; capacitance; power amplifiers; radiofrequency integrated circuits; 0.5 micron; 23.9 dB; CMOS; Volterra analysis; Volterra series; WCDMA; adjacent-channel leakage power; adjacent-channel power ratio; capacitance-compensation; class-AB power amplifiers; computer simulations; intermodulation distortion; linearity; radio-frequency circuits; CMOS process; Capacitance; Computer simulation; Distortion measurement; Linearity; MOS devices; Power amplifiers; Power generation; Power measurement; Prototypes; ACPR; Adjacent-channel power ratio; CMOS; RF; Volterra series; WCDMA; circuits; class-AB power amplifiers; intermodulation distortion; linearity; radio-frequency;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2004.835834