Title :
An X-Band Focussed-Beam Interferometer for Plasma Diagnostics
Author_Institution :
Cornell Aeronautical Lab., Inc., Buffalo, N. Y. 14221
fDate :
5/1/1971 12:00:00 AM
Abstract :
A microwave interferometer which permits the measurement of phase shift in a plasma independent of propagation path attenuation over a 30-dB dynamic range is described. Results are presented from an experimental evaluation of measurement accuracy of the interferometer instrument.
Keywords :
Attenuation; Fluctuations; Klystrons; Phase measurement; Phase modulation; Phase shifting interferometry; Plasma confinement; Plasma diagnostics; Plasma measurements; Plasma sources;
Journal_Title :
Aerospace and Electronic Systems, IEEE Transactions on
DOI :
10.1109/TAES.1971.310300
