DocumentCode :
1145181
Title :
Efficient inductance extraction using circuit-aware techniques
Author :
Hu, Haitian ; Sapatnekar, Sachin S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Minnesota Univ., MN, USA
Volume :
10
Issue :
6
fYear :
2002
Firstpage :
746
Lastpage :
761
Abstract :
Proposes two practical approaches for on-chip inductance extraction to obtain a highly sparsified and accurate inverse inductance matrix K. Both approaches differ from previous methods in that they use circuit characteristics to obtain a sparse, stable and symmetric K, using the concept of resistance-dominant and inductance-dominant lines. Specifically, they begin by finding inductance-dominant lines and forming initial clusters, followed by heuristically enlarging and/or combining these clusters, with the goal of including only the important inductance terms in the sparsified K matrix. Algorithm 1 permits the influence of the magnetic field of aggressor lines to reach the edge of the chip, while Algorithm 2 works under the simplified assumptions that the supply lines have zero /spl Sigma//sub j/L/sub ij/(dI/sub j//dt) drops (but have nonzero parasitic Rs and Cs) and that currents cannot return through supply lines beyond a user-defined distance. For reasonable designs, Algorithm 1 delivers a sparsification of 97% for delay and oscillation magnitude errors of 10% and 15%, respectively, as compared to Algorithm 2 where the sparsification can reach 99% for the same delay error.
Keywords :
VLSI; circuit CAD; circuit simulation; inductance; integrated circuit interconnections; integrated circuit modelling; sparse matrices; circuit-aware techniques; inductance extraction; inductance-dominant lines; initial clusters; inverse inductance matrix; nonzero parasitic; oscillation magnitude errors; sparsification; sparsified K matrix; supply lines; user-defined distance; Circuits; Clocks; Clustering algorithms; Delay; Inductance; Magnetic fields; Signal analysis; Sparse matrices; Symmetric matrices; Wire;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2002.808455
Filename :
1178846
Link To Document :
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