Title :
Comments on "Observations on component infant mortality and burn-in effectiveness
fDate :
6/1/2009 12:00:00 AM
Abstract :
This paper presents the comments of the author on the work of Mr. Cooper (2008) by pointing out two concerns: First, the discussion of burn-in, and the tone of one of the major references (van der Pol et al. (1998)), would lead one to believe that burn-in is the only screen currently or commonly used to identify infant mortality or to detect substandard components. Second, it appears that Cooper´s assumptions regarding acceleration factors may be suitable in cases where burn-in is the only screen in use, where the defects are susceptible to the burn-in stresses, and where only a limited number of different failure modes are present.
Keywords :
failure analysis; integrated circuit testing; acceleration factors; burn-in effectiveness; component infant mortality; failure mechanisms; failure modes; screening program; substandard component detection; Acceleration; Capacitors; Conferences; Electronic components; Fabrication; Physics; Temperature; Testing; Thermal stresses; Voltage;
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
DOI :
10.1109/TCAPT.2009.2023313