Title :
Bayes estimation of reliability under a random environment governed by a Dirichlet prior
Author :
Kumar, S. ; Tiwari, Ram C.
Author_Institution :
North Carolina Univ., Charlotte, NC, USA
fDate :
6/1/1989 12:00:00 AM
Abstract :
The reliability function of a component whose lifetime is exponentially distributed with a known parameter λ>0 is R (t|λ)=exp (-λt). If an environmental effect multiplies the parameter by a positive factor η, then the reliability function becomes R(t|η,λ)=exp(-ηλt). The authors assume that η itself is random, and its uncertainty is described by a Dirichlet process prior D(α) with parameter α=MG0, where M>O represents an intensity of assurance in the prior guess, G0, of the (unknown) distribution of η. Under squared error loss, the Bayes estimator of R(t|η,λ) is derived both for the no-sample problem and for a sample of size n. Using Monte Carlo simulation, the effects of n, M, G0 on the estimator are studied. These examples show that: (a) large values of n lead to estimates where the data outweigh the prior, and (b) large values of M increase the contribution of the prior to the estimates. These simulation results support intuitive ideas about the effect of environment and lifetime parameters on reliability
Keywords :
Bayes methods; reliability theory; Bayes estimator; Dirichlet process prior; Monte Carlo simulation; lifetime parameters; random environment; reliability; Exponential distribution; Life estimation; Random variables; Reliability theory; Testing; Uncertainty;
Journal_Title :
Reliability, IEEE Transactions on