DocumentCode
1145262
Title
Bayes estimation of reliability under a random environment governed by a Dirichlet prior
Author
Kumar, S. ; Tiwari, Ram C.
Author_Institution
North Carolina Univ., Charlotte, NC, USA
Volume
38
Issue
2
fYear
1989
fDate
6/1/1989 12:00:00 AM
Firstpage
218
Lastpage
223
Abstract
The reliability function of a component whose lifetime is exponentially distributed with a known parameter λ>0 is R (t |λ)=exp (-λt ). If an environmental effect multiplies the parameter by a positive factor η, then the reliability function becomes R (t |η,λ)=exp(-ηλt ). The authors assume that η itself is random, and its uncertainty is described by a Dirichlet process prior D (α) with parameter α=MG 0, where M >O represents an intensity of assurance in the prior guess, G 0, of the (unknown) distribution of η. Under squared error loss, the Bayes estimator of R (t |η,λ) is derived both for the no-sample problem and for a sample of size n . Using Monte Carlo simulation, the effects of n , M , G 0 on the estimator are studied. These examples show that: (a) large values of n lead to estimates where the data outweigh the prior, and (b) large values of M increase the contribution of the prior to the estimates. These simulation results support intuitive ideas about the effect of environment and lifetime parameters on reliability
Keywords
Bayes methods; reliability theory; Bayes estimator; Dirichlet process prior; Monte Carlo simulation; lifetime parameters; random environment; reliability; Exponential distribution; Life estimation; Random variables; Reliability theory; Testing; Uncertainty;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.31110
Filename
31110
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