• DocumentCode
    1145280
  • Title

    Algorithm level re-computing using implementation diversity: a register transfer level concurrent error detection technique

  • Author

    Karri, Ramesh ; Wu, Kaijie

  • Author_Institution
    Electr. & Comput. Eng. Dept., Polytech. Univ., Brooklyn, NY, USA
  • Volume
    10
  • Issue
    6
  • fYear
    2002
  • Firstpage
    864
  • Lastpage
    875
  • Abstract
    Concurrent error detection (CED) based on time redundancy entails performing the normal computation and the re-computation at different times and then comparing their results. Time redundancy implemented can only detect transient faults. We present two algorithm-level time-redundancy-based CED schemes that exploit register transfer level (RTL) implementation diversity to detect transient and permanent faults. At the RTL, implementation diversity can be achieved either by changing the operation-to-operator allocation or by shifting the operands before re-computation. By exploiting allocation diversity and data diversity, a stuck-at fault will affect the two results in two different ways. The proposed schemes yield good fault detection probability with very low area overhead. We used the Synopsys behavior complier (BC), to validate the schemes.
  • Keywords
    VLSI; error detection; fault tolerant computing; logic testing; probability; redundancy; RTL concurrent error detection technique; RTL implementation diversity; Synopsys behavior complier; algorithm level re-computing; allocation diversity; combinational logic; data diversity; fault detection probability; fault tolerance; low area overhead; operation-to-operator allocation; permanent faults; register transfer level; scheme validation; sequential logic; stuck-at fault; time redundancy; transient faults; Circuit faults; Clocks; Combinational circuits; Error analysis; Fault detection; Frequency; Registers; Sequential circuits; Single event upset; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2002.808440
  • Filename
    1178856