DocumentCode :
1145280
Title :
Algorithm level re-computing using implementation diversity: a register transfer level concurrent error detection technique
Author :
Karri, Ramesh ; Wu, Kaijie
Author_Institution :
Electr. & Comput. Eng. Dept., Polytech. Univ., Brooklyn, NY, USA
Volume :
10
Issue :
6
fYear :
2002
Firstpage :
864
Lastpage :
875
Abstract :
Concurrent error detection (CED) based on time redundancy entails performing the normal computation and the re-computation at different times and then comparing their results. Time redundancy implemented can only detect transient faults. We present two algorithm-level time-redundancy-based CED schemes that exploit register transfer level (RTL) implementation diversity to detect transient and permanent faults. At the RTL, implementation diversity can be achieved either by changing the operation-to-operator allocation or by shifting the operands before re-computation. By exploiting allocation diversity and data diversity, a stuck-at fault will affect the two results in two different ways. The proposed schemes yield good fault detection probability with very low area overhead. We used the Synopsys behavior complier (BC), to validate the schemes.
Keywords :
VLSI; error detection; fault tolerant computing; logic testing; probability; redundancy; RTL concurrent error detection technique; RTL implementation diversity; Synopsys behavior complier; algorithm level re-computing; allocation diversity; combinational logic; data diversity; fault detection probability; fault tolerance; low area overhead; operation-to-operator allocation; permanent faults; register transfer level; scheme validation; sequential logic; stuck-at fault; time redundancy; transient faults; Circuit faults; Clocks; Combinational circuits; Error analysis; Fault detection; Frequency; Registers; Sequential circuits; Single event upset; Very large scale integration;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2002.808440
Filename :
1178856
Link To Document :
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