Title :
Observation of temperature-independent longitudinal-mode patterns in violet-blue InGaN-based laser diodes
Author :
Eichler, Christoph ; Schad, Sven-Silvius ; Scholz, Ferdinand ; Hofstetter, Daniel ; Miller, Stephan ; Weimar, Andreas ; Lell, Alfred ; Härle, Volker
Author_Institution :
Osram Opto Semicond., Regensburg, Germany
Abstract :
We present measurements on an aperiodic device-specific longitudinal-mode pattern in InGaN laser diodes. The characteristic shape of this pattern occurs only if the laser is driven slightly above threshold; in addition, it tunes with temperature at exactly the same rate as the cavity modes. By careful selection of the collection optics and averaging ten rapid scans over 15 min in a high-resolution Fourier transform spectrometer, we could exclude possible explanations like beating of mode families, self-pulsation, or external reflections. A naive simulation of the longitudinal modes profiting from their individual "gain profile" along the cavity suggests that we see the signature of quantum-well thickness fluctuations.
Keywords :
Fourier transform spectrometers; III-V semiconductors; gallium compounds; indium compounds; laser cavity resonators; laser modes; laser variables measurement; semiconductor device measurement; semiconductor lasers; wide band gap semiconductors; Fourier transform spectrometer; InGaN; cavity modes; external reflections; gain profile; longitudinal-mode patterns; mode beating; self-pulsation; violet-blue InGaN-based laser diodes; Diode lasers; Fluctuations; Fourier transforms; Laser modes; Laser tuning; Optical reflection; Quantum wells; Shape; Spectroscopy; Temperature; Emission spectrum; InGaN laser diodes; irregular spectral envelope;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2005.852644