Title :
In situ temperature and strain instrumentation for harsh electromagnetic environments
Author :
Hoffman, Ryan ; Haran, Terence L. ; James, Jonathan Christopher ; Vaughan, R. Brandon ; Lamb, C. ; Meraz, Nathan
Author_Institution :
Office of Naval Res., Washington, DC, USA
Abstract :
The challenging physical environment associated with electromagnetic launchers (EMLs) makes reliable in situ measurements of physical parameters particularly difficult. The resulting lack of data hinders the validation of simulation codes that are used to support the design of new electromagnetic launchers. As a result, there have been substantial efforts to develop new instrumentation that is compatible with the harsh environment of an electromagnetic launcher. This paper will describe recent developments from Georgia Tech and US Navy research to improve instrumentation capabilities for temperature and strain.
Keywords :
electromagnetic launchers; EML; Georgia Tech developments; US Navy research developments; electromagnetic launchers; harsh electromagnetic environments; in situ temperature; simulation codes; strain instrumentation; Optical fiber sensors; Optical fibers; Phosphors; Rails; Strain; Strain measurement; Temperature measurement;
Conference_Titel :
Electromagnetic Launch Technology (EML), 2014 17th International Symposium on
Conference_Location :
La Jolla, CA
DOI :
10.1109/EML.2014.6920693