DocumentCode
1145565
Title
Fault Diagnosis in Synchronous Sequential Circuits Based on an Effect–Cause Analysis
Author
Abramovici, Miron ; Breuer, Melvin A.
Author_Institution
Bell Laboratories
Issue
12
fYear
1982
Firstpage
1165
Lastpage
1172
Abstract
In this paper we present a new approach to fault diagnosis in sequential circuits based on an effect–cause analysis. This represents an extension of our previous work dealing with combinational circuits [1]. The main tool of our approach is the Deduction Algorithm, which deduces internal values in the circuit under test based upon the test results. The deduced values are used for fault diagnosis, which encompasses both fault detection and location.
Keywords
Circuit initialization; effect–cause analysis; fault diagnosis; functional and structural equivalence relations; sequential circuits; single and multiple stuck faults; Cause effect analysis; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Computational modeling; Dictionaries; Electrical fault detection; Fault diagnosis; Sequential circuits; Circuit initialization; effect–cause analysis; fault diagnosis; functional and structural equivalence relations; sequential circuits; single and multiple stuck faults;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1982.1675940
Filename
1675940
Link To Document