Title :
Spot-size dependence of laser-induced damage thresholds of dielectric thin films
Author :
Newnam, B. ; DeShazer, L.
Author_Institution :
University of Southern California, Los Angeles, CA, USA
fDate :
6/1/1972 12:00:00 AM
Keywords :
Coatings; Dielectric measurements; Dielectric thin films; Electrical resistance measurement; Glass; Laser beams; Laser modes; Lenses; Substrates; Testing;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1972.1077055
