Title :
Multiple storage of thick phase holograms in LiNbO3
Author :
Staebler, D. ; Amodei, J. ; Phillips, William
Author_Institution :
RCA Laboratories, Princeton, NJ, USA
fDate :
6/1/1972 12:00:00 AM
Keywords :
Coatings; Dielectric measurements; Dielectric thin films; Electrical resistance measurement; Glass; Laser beams; Laser modes; Lenses; Substrates; Testing;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1972.1077069
