Stress-induced frequency shifts in langasite thickness-mode resonators

Author

Kosinski, John A. ; Pastore, Robert A., Jr. ; Yang, Xiaomeng ; Yang, Jiashi ; Turner, Joseph A.

Author_Institution

U.S. Army Commun. & Electron. Command, Fort Monmouth, NJ

Volume

56

Issue

1

fYear

2009

fDate

1/1/2009 12:00:00 AM

Firstpage

129

Lastpage

135

Abstract

In this paper, we report on our study of stress induced effects on thickness vibrations of a langasite plate. The plate is assumed to be doubly rotated, specified by angles phi and thetas. The stresses are assumed to be uniform and planar. The first-order perturbation integral as developed by Tiersten for frequency shifts in resonators is used. The dependence of frequency shifts on phi and thetas is calculated and examined, and loci of stress-compensation are determined.

Keywords

crystal resonators; gallium compounds; lanthanum compounds; polynomials; stress effects; vibrations; La₃Ga₅SiO₁₄; first-order perturbation integral; langasite plate; langasite thickness-mode resonators; piezoelectric resonator; polynomial equation; stress-compensation; stress-induced frequency shifts; vibrations; Anisotropic magnetoresistance; Boundary conditions; Capacitive sensors; Elasticity; Equations; Piezoelectricity; Resonant frequency; Stress; Transmission line matrix methods; Vibrations;

fLanguage

English

Journal_Title

Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on

Publisher

ieee

ISSN

0885-3010

Type

jour

DOI

10.1109/TUFFC.2009.1012

Filename

4775271