• DocumentCode
    1146094
  • Title

    Investigation of the four-gate action in G4-FETs

  • Author

    Dufrene, B. ; Akarvardar, K. ; Cristoloveanu, S. ; Blalock, B.J. ; Gentil, P. ; Kolawa, E. ; Mojarradi, M.M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Tennessee Univ., Knoxville, TN, USA
  • Volume
    51
  • Issue
    11
  • fYear
    2004
  • Firstpage
    1931
  • Lastpage
    1935
  • Abstract
    The four-gate silicon-on-insulator transistor (G4-FET) combines MOS and JFET actions in a single transistor to control the drain current. The various operation modes of the G4-FET are analyzed, based on the measured current-voltage, transconductance and threshold characteristics. The main parameters (threshold voltage, swing, mobility) are extracted and shown to be optimized for particular combinations of gate biasing. Numerical simulations are used to clarify the role of volume or interface conduction mechanisms. Besides excellent performance (such as subthreshold swing and transconductance) and unchallenged flexibility, the new device has the unique feature to allow independent switching by its four separate gates, which inspires many innovative applications.
  • Keywords
    MOSFET; carrier mobility; junction gate field effect transistors; silicon-on-insulator; G4-FET; JFET action; MOSFET action; SOI; carrier mobility; current-voltage characteristics; drain current control; four-gate action; four-gate silicon-on-insulator transistor; gate biasing; independent gate switching; interface conduction mechanisms; multiple-gate transistor; subthreshold swing; threshold voltage; transconductance; volume conduction mechanisms; Current measurement; Laboratories; MOSFET circuits; Microelectronics; Performance analysis; Propulsion; Silicon on insulator technology; Threshold voltage; Transconductance; Voltage control; JFET; MOSFET; SOI; multiple-gate transistor; silicon-on-insulator;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2004.836548
  • Filename
    1347414