Impact of microstructure on stability of permanent magnet biased magnetoresistive heads

Author

Zhu, Jim-Gang ; Connor, Daniel J O

Author_Institution

MINT, Minnesota Univ., Minneapolis, MN, USA

Volume

32

Issue

1

fYear

1996

fDate

1/1/1996 12:00:00 AM

Firstpage

54

Lastpage

60

Abstract

This work pertains to output voltage stability of soft adjacent layer biased magnetoresistive heads with abutted permanent magnetic films for domain stabilization. A micromagnetic model has been developed to study the effect of the permanent magnet film microstructure and the micromagnetic properties of the abutted junction interface on head stability. The impact on head stability is analyzed with respect to interfacial ferromagnetic coupling across the junction interface and intergranular exchange coupling in the permanent magnet films among other film properties

Keywords

magnetic heads; magnetoresistive devices; permanent magnets; abutted junction; biased magnetoresistive head; domain stability; interfacial ferromagnetic coupling; intergranular exchange coupling; micromagnetic model; microstructure; output voltage stability; permanent magnetic film; soft adjacent layer; Couplings; Magnetic films; Magnetic heads; Magnetic properties; Magnetoresistance; Micromagnetics; Microstructure; Permanent magnets; Stability; Voltage;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.477550

Filename

477550