DocumentCode
1146545
Title
The Reliability of Memory with Single-Error Correction
Author
Mikhail, W.F. ; Bartoldus, R.W. ; Rutledge, R.A.
Author_Institution
IBM Corporation
Issue
6
fYear
1982
fDate
6/1/1982 12:00:00 AM
Firstpage
560
Lastpage
564
Abstract
This correspondence contains the derivation of the reliability, as a function of time, of semiconductor memory with single-error correction. The results are applicable to a wide range of memory organizations.
Keywords
Error-correcting codes; fault-tolerant systems; memory reliability; semiconductior memory; single-error correction; Differential equations; Error analysis; Error correction; Error correction codes; Fault tolerant systems; Semiconductor device measurement; Semiconductor device reliability; Semiconductor memory; Error-correcting codes; fault-tolerant systems; memory reliability; semiconductior memory; single-error correction;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1982.1676042
Filename
1676042
Link To Document