DocumentCode
114672
Title
A martingale approach and time-consistent sampling-based algorithms for risk management in stochastic optimal control
Author
Vu Anh Huynh ; Kogan, Leonid ; Frazzoli, Emilio
Author_Institution
Lab. for Inf. & Decision Syst., Massachusetts Inst. of Technol., Cambridge, MA, USA
fYear
2014
fDate
15-17 Dec. 2014
Firstpage
1858
Lastpage
1865
Abstract
In this paper, we consider a class of stochastic optimal control problems with risk constraints that are expressed as bounded probabilities of failure for particular initial states. We present here a martingale approach that diffuses a risk constraint into a martingale to construct time-consistent control policies. The martingale stands for the level of risk tolerance that is contingent on available information over time. By augmenting the system dynamics with the controlled martingale, the original risk-constrained problem is transformed into a stochastic target problem. We extend the incremental Markov Decision Process (iMDP) algorithm to approximate arbitrarily well an optimal feedback policy of the original problem by sampling in the augmented state space and computing proper boundary conditions for the reformulated problem. We show that the algorithm is both probabilistically sound and asymptotically optimal. The performance of the proposed algorithm is demonstrated on motion planning and control problems subject to bounded probability of collision in uncertain cluttered environments.
Keywords
Markov processes; optimal control; risk management; stochastic systems; bounded collision probability; iMDP algorithm; incremental Markov decision process; martingale approach; motion control; motion planning; optimal feedback policy; risk constraints; risk management; risk tolerance; stochastic optimal control; time-consistent control policy; time-consistent sampling-based algorithm; Approximation algorithms; Approximation methods; Manganese; Markov processes; Optimal control; Process control; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Decision and Control (CDC), 2014 IEEE 53rd Annual Conference on
Conference_Location
Los Angeles, CA
Print_ISBN
978-1-4799-7746-8
Type
conf
DOI
10.1109/CDC.2014.7039669
Filename
7039669
Link To Document