DocumentCode
1146788
Title
Development of a hexagonal-shaped rapid thermal processor using a vertical tube
Author
Cho, Byung-Jin ; Vandenabeele, Peter ; Maex, Karen
Author_Institution
IMEC, Leuven, Belgium
Volume
7
Issue
3
fYear
1994
fDate
8/1/1994 12:00:00 AM
Firstpage
345
Lastpage
353
Abstract
A new RTP system concept is proposed and demonstrated. The system uses a vertical cylindrical quartz tube, while the wafer is placed horizontally. Linear halogen lamps are arranged in a hexagonal shape, and the hexagonal-shaped lamp groups are stacked vertically. Each lamp group is controlled independently, allowing a temperature difference within ±1.5°C to be achieved over a 6-in wafer in steady state. Oxidation under optimal power condition results in a 1.37% standard deviation for an average oxide thickness of 110.4 Å. The temperature nonuniformity during the transient has been greatly improved by using dynamic control. The convection loss in the system has been evaluated and its radial dependence is found to be smoother in this chamber than in a conventional rectangular chamber. The ray-tracing simulation in three-dimensional space did result in a better comprehension of the optically complex system. The system efficiency has turned out to be lower than in the case of a conventional rectangular chamber. A large portion of the radiation energy is absorbed by the reflectors. There is a strong side heating to the vertical edge of the wafer. Both are due to multiple horizontal reflections of the rays on the reflectors without hitting the wafer. The temperature profiles calculated from the ray-tracing results show an excellent agreement with experiments and confirm the accuracy of the ray-tracing simulation. The main advantages of this new system concept are its excellent temperature uniformity and the good accessibility of the wafer for technological treatments and in situ measurements
Keywords
convection; heat losses; integrated circuit manufacture; oxidation; quartz; rapid thermal processing; ray tracing; semiconductor technology; simulation; temperature distribution; thermal analysis; 6 in; RTP system; SiO2; convection loss; cylindrical quartz tube; dynamic control; halogen lamps; hexagonal-shaped processor; multiple horizontal reflections; rapid thermal processor; ray-tracing simulation; temperature profiles; temperature uniformity; vertical tube; Heating; Lamps; Optical losses; Optical reflection; Oxidation; Rapid thermal processing; Ray tracing; Shape; Steady-state; Temperature control;
fLanguage
English
Journal_Title
Semiconductor Manufacturing, IEEE Transactions on
Publisher
ieee
ISSN
0894-6507
Type
jour
DOI
10.1109/66.311338
Filename
311338
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