• DocumentCode
    114685
  • Title

    Amorphous oxide electronics

  • Author

    Nathan, Arokia

  • Author_Institution
    Electr. Eng. Div., Cambridge Univ., Cambridge, UK
  • fYear
    2014
  • fDate
    27-29 Aug. 2014
  • Abstract
    Summary form only given. Oxide semiconductors are known for their optical transparency and high electron mobility even when processed at room temperature, making them a promising candidate for the next-generation thin film transistor (TFT) technology. Compared to existing well-established TFT technologies, the oxide transistor shows superiority in terms of process simplicity and cost, and stable device behaviour in the dark. While its non-uniformity over large areas is comparable to that of thin film silicon transistors, its photo-instability at low wavelengths can be an issue due to persistence in photoconductivity. This talk will discuss progress and issues related to oxide transistors for large area applications, and in particular, show how the material can be tuned for displays and imaging applications.
  • Keywords
    electron mobility; photoconductivity; thin film transistors; amorphous oxide electronics; device behaviour stability; display application; high-electron mobility; imaging application; next-generation TFT technology; next-generation thin film transistor technology; optical transparency; oxide transistor; photoconductivity; photoinstability; process simplicity; room temperature; thin film silicon transistors; Abstracts; Educational institutions; Electrical engineering; Electron optics; Electronic mail; Thin film transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics (ICSE), 2014 IEEE International Conference on
  • Conference_Location
    Kuala Lumpur
  • Type

    conf

  • DOI
    10.1109/SMELEC.2014.6920777
  • Filename
    6920777