DocumentCode :
1146912
Title :
Intermodulation-distortion performance of silicon-carbide Schottky-barrier RF mixer diodes
Author :
Simons, Rainee N. ; Neudeck, Philip G.
Author_Institution :
NASA Glenn Res. Center, Cleveland, OH, USA
Volume :
51
Issue :
2
fYear :
2003
fDate :
2/1/2003 12:00:00 AM
Firstpage :
669
Lastpage :
672
Abstract :
This paper presents the fabrication and characterization of silicon carbide (SiC) Schottky-barrier mixer diodes of 25- and 50-μm diameter on a conducting 4H-SiC wafer. The single-balanced mixer circuits with a diode in each arm (two diodes total) were tested at 200 MHz (VHF) and 1.5 GHz [global positioning system (GPS)]. The experiments show that the conversion loss/input third-order intercept point (IP3) are 8.0 dB/+25 dBm and 7.5 dB/+22 dBm at these frequencies, respectively. The measured second-order intercept point (IP2) over the VHF frequency band is +38 dBm. The above conversion-loss values are about the same as that of commercially available single-balanced mixers with silicon Schottky-barrier diodes. However, to achieve a comparable input IP3 performance with Si Schottky-barrier diodes, a more complex mixer design involving double-balanced mixers with two diodes in each arm of a quad (eight diodes total) is required. Applications include RF-based navigational instruments on board commercial/general aviation aircraft and GPSs.
Keywords :
Global Positioning System; Schottky diodes; UHF diodes; UHF integrated circuits; UHF mixers; intermodulation distortion; losses; silicon compounds; wide band gap semiconductors; 1.5 GHz; 200 MHz; 25 micron; 50 micron; RF-based navigational instruments; Schottky-barrier RF mixer diodes; SiC; VHF; above conversion-loss values; conversion loss/input third-order intercept point; double-balanced mixers; global positioning system; intermodulation-distortion performance; second-order intercept point; single-balanced mixer circuits; Aircraft navigation; Circuit testing; Fabrication; Global Positioning System; Mixers; Radio frequency; Schottky diodes; Silicon carbide; System testing; VHF circuits;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2002.807689
Filename :
1179395
Link To Document :
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