DocumentCode :
1147301
Title :
A class of analytical absorbing boundary conditions originating from the exact surface impedance boundary condition
Author :
Kärkkäinen, Mikko K. ; Tretyakov, Sergei A.
Author_Institution :
Radio Lab., Helsinki Univ. of Technol., Finland
Volume :
51
Issue :
2
fYear :
2003
Firstpage :
560
Lastpage :
563
Abstract :
A new class of analytical absorbing boundary conditions (ABCs) for the truncation of the finite-difference time-domain (FDTD) lattice is introduced. These ABC originate from the exact impedance boundary operator and contain both electric and magnetic fields. The performance of the proposed second-order ABCs is studied with a two-dimensional FDTD program. The results indicate that the proposed ABCs work approximately as well as the third-order analytical ABCs, even if they are essentially as easy to implement as the second-order Mur ABC. Also, in this paper, the relation between the so-called Engquist-Majda operator for the absorption of plane waves and the exact surface impedance boundary condition is discussed.
Keywords :
computational electromagnetics; electromagnetic field theory; electromagnetic wave absorption; electromagnetic wave propagation; electromagnetic wave reflection; electromagnetic wave scattering; finite difference time-domain analysis; surface impedance; 2D FDTD program; Engquist-Majda operator; analytical absorbing boundary conditions; electric fields; exact impedance boundary operator; exact surface impedance boundary condition; finite-difference time-domain lattice truncation; magnetic fields; plane wave absorption; second-order ABC; second-order Mar ABC; third-order analytical ABC; Absorption; Boundary conditions; Computational modeling; Equations; Finite difference methods; Lattices; Magnetic analysis; Magnetic fields; Surface impedance; Time domain analysis;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2002.807816
Filename :
1179428
Link To Document :
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