Title :
Physical and optical studies on ZnO films by SOL-GEL
Author :
Nurulfadzilah, A.R. ; Tawil, S.N.M. ; Norhidayah, C.A. ; Nafarizal, N. ; Sahdan, Mohd Zainizan
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. Pertahanan Nasional Malaysia, Sungai Besi, Malaysia
Abstract :
Zinc oxide (ZnO) is a new material used in electronics applications such as spintronics, diluted magnetic semiconductor (DMS) and thin films. In this paper, the findings in fabrication and characterization of ZnO nanoparticles are reported. ZnO thin films were deposited onto glass substrates using a spin coating techniques at different pre-annealing temperatures. The optical transmittance measurement of the ZnO nanostructures was examined using an ultraviolet-visible spectrophotometer (UV-Vis) with wavelength ranging from 300-800 nm. On the other hand, the topography and film roughness were, measured by an atomic force microscope (AFM). The surface morphologies was obtained using a field emission scanning electron microscope (FESEM) and showed that the ZnO nanoparticles are distributed uniformly.
Keywords :
II-VI semiconductors; annealing; atomic force microscopy; field emission electron microscopy; nanofabrication; nanoparticles; scanning electron microscopy; semiconductor growth; semiconductor thin films; sol-gel processing; spin coating; surface morphology; surface roughness; ultraviolet spectra; visible spectra; zinc compounds; AFM; FESEM; SiO2; UV-vis spectrophotometry; ZnO; atomic force microscopy; diluted magnetic semiconductor; electronics applications; field emission scanning electron microscopy; film roughness; glass substrates; nanoparticles; optical transmittance measurement; physical study; preannealing temperatures; sol-gel method; spin coating; spintronics; surface morphologies; surface topography; thin films; ultraviolet-visible spectrophotometry; wavelength 300 nm to 800 nm; zinc oxide nanostructures; Coatings; Optical films; Optical surface waves; Surface topography; Temperature measurement; Zinc oxide; ZnO; optical measurement; sol-gel; spin coating; topography;
Conference_Titel :
Semiconductor Electronics (ICSE), 2014 IEEE International Conference on
Conference_Location :
Kuala Lumpur
DOI :
10.1109/SMELEC.2014.6920803