• DocumentCode
    1147421
  • Title

    Physics-Based Via and Trace Models for Efficient Link Simulation on Multilayer Structures Up to 40 GHz

  • Author

    Rimolo-Donadio, Renato ; Gu, Xiaoxiong ; Kwark, Young H. ; Ritter, Mark B. ; Archambeault, Bruce ; De Paulis, Francesco ; Zhang, Yaojiang ; Fan, Jun ; Brüns, Heinz-Dietrich ; Schuster, Christian

  • Author_Institution
    Inst. for Electromagn. Theor., Tech. Univ. of Hamburg-Harburg, Hamburg, Germany
  • Volume
    57
  • Issue
    8
  • fYear
    2009
  • Firstpage
    2072
  • Lastpage
    2083
  • Abstract
    Analytical models for vias and traces are presented for simulation of multilayer interconnects at the package and printed circuit board levels. Vias are modeled using an analytical formulation for the parallel-plate impedance and capacitive elements, whereas the trace-via transitions are described by modal decomposition. It is shown that the models can be applied to efficiently simulate a wide range of structures. Different scenarios are analyzed including thru-hole and buried vias, power vias, and coupled traces routed into different layers. By virtue of the modal decomposition, the proposed method is general enough to handle structures with mixed reference planes. For the first time, these models have been validated against full-wave methods and measurements up to 40 GHz. An improvement on the computation speed of at least two orders of magnitude has been observed with respect to full-wave simulations.
  • Keywords
    integrated circuit interconnections; integrated circuit packaging; multilayers; power supplies to apparatus; printed circuits; capacitive element; full-wave simulation; modal decomposition; multilayer interconnects; multilayer structures; parallel-plate impedance element; physics-based trace model; physics-based via model; printed circuit board; Modal decomposition; package; power distribution network (PDN); printed circuit board (PCB); via models;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2009.2025470
  • Filename
    5173506