• DocumentCode
    1147445
  • Title

    Simplified analytical quasi-transparent solution for minority carrier transport in non-uniformly doped quasi-neutral semiconductor regions

  • Author

    Hamel, John S.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Canterbury Univ., Christchurch, New Zealand
  • Volume
    43
  • Issue
    1
  • fYear
    1996
  • fDate
    1/1/1996 12:00:00 AM
  • Firstpage
    104
  • Lastpage
    109
  • Abstract
    A simple analytical solution, which retains a general dependence of transport parameters on impurity concentration, is presented for minority carrier transport in nonuniformly doped semiconductor quasineutral regions. The new solution exhibits improved accuracy for high surface recombination velocities over all previous solutions of the same degree of analytic complexity which retain a general dependence of the transport parameters on impurity concentration, while retaining the same degree of accuracy for low surface recombination velocities as the most accurate of these previous solutions. The proposed solution exhibits accuracy comparable to significantly more complex third order expressions which are derived by three iterations using a systematic approach
  • Keywords
    bipolar transistors; doping profiles; impurity distribution; minority carriers; semiconductor device models; semiconductor doping; surface recombination; analytical quasi-transparent solution; bipolar transistors; impurity concentration; minority carrier transport; nonuniformly doped quasi-neutral semiconductor regions; surface recombination velocities; Analytical models; Computational efficiency; Design engineering; Photonic band gap; Photovoltaic cells; Power engineering computing; Radiative recombination; Semiconductor impurities; Semiconductor materials; Terrorism;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.477599
  • Filename
    477599