Title :
A Class of Test Generators for Built-In Testing
Author :
Aboulhamid, M.E. ; Cerny, E.
Author_Institution :
Department of Mathematics, Université du Québec
Abstract :
Currently proposed and used schemes for built-in testing (B-I-T) use as test generators either binary counters (exhaustive testing), linear feedback shift registers (semiexhaustive testing), or ROM´s containing the test vectors (prestored testing). The disadvantages of these methods have been discussed in [4], and a store-and-generate B-I-T arrangement was proposed as a compromise between the exhaustive and the prestored form of test generation. Unfortunately, no systematic method was given for producing tests.
Keywords :
Anti-self-dual functions; built-in testing; coding; test generator; test set compression; Circuit testing; Counting circuits; Integrated circuit testing; Linear feedback shift registers; Logic circuits; Logic testing; Read only memory; Sequential analysis; System testing; Vectors; Anti-self-dual functions; built-in testing; coding; test generator; test set compression;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1983.1676141
