Title :
A New Empirical Test for the Quality of Random Integer Generators
Author_Institution :
IBM T. J. Watson Research Center
Abstract :
In a number of applications, it is necessary to generate stimnuli: to generate random patterns when random testing of logic faults is employed, and to generate the random occurrence of events when simulation is used, to mention two. In this paper, we show a quick empirical test, which is based on a data compression method, to analyze the pseudorandom integers generated by certain types of random integer generators and to determine whether the approximation to a true random process is good.
Keywords :
Confidence interval; mean; random integer generator; variance; Data compression; Difference equations; Discrete event simulation; Frequency; Jacobian matrices; Logic testing; Random number generation; Random processes; Reactive power; Test pattern generators; Confidence interval; mean; random integer generator; variance;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1983.1676142