Measurement of semiconductor optical index variation in photonic devices based on optical heterodyning microwave experiments

Author

Dupont, Samuel ; Blary, Karine ; Vilcot, J.-P. ; Li, H.W. ; Decoster, D. ; Chazelas, J.

Author_Institution

Inst. d´Electronique et de Microelectronique de Lille, Univ. des Sci. et Technol. de Lille, Villeneuve d´Ascq, France

Volume

39

Issue

3

fYear

2003

fDate

2/6/2003 12:00:00 AM

Firstpage

295

Lastpage

296

Abstract

Regarding integrated optics devices, the variation of propagation effective index is measured using an heterodyne detection scheme. Optical phase shift is so directly transferred in the microwave frequency range allowing phase measurements using common microwave network analysers. This technique is applied to a DOS (digital optical switch) technique based switch.

Keywords

heterodyne detection; integrated optics; microwave measurement; microwave photonics; optical switches; phase measurement; refractive index measurement; VNA measurements; digital optical switches; heterodyne detection scheme; integrated optics devices; microwave frequency range; microwave network analysers; microwave phase measurements; optical heterodyning microwave experiments; optical phase shift transfer; photonic devices; propagation effective index variation; semiconductor optical index variation measurement; vector network analyser;

fLanguage

English

Journal_Title

Electronics Letters

Publisher

iet

ISSN

0013-5194

Type

jour

DOI

10.1049/el:20030224

Filename

1179460