DocumentCode :
1147730
Title :
The Pattern Analysis and Machine Intelligence Technical Committee
Author :
Bowyer, K.W. ; Price, K. ; Shafer, S. ; Boult, T. ; Shapiro, L.
Volume :
28
Issue :
12
fYear :
1995
Firstpage :
91
Keywords :
Computer vision; Machine intelligence; Pattern analysis; Pattern recognition;
fLanguage :
English
Journal_Title :
Computer
Publisher :
ieee
ISSN :
0018-9162
Type :
jour
DOI :
10.1109/MC.1995.477620
Filename :
477620
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1147730
