Title :
Experimental and numerical verification of the cause of Hopf bifurcation in a microwave doubler
Author :
Basu, Saswata ; Maas, Stephen A. ; Itoh, Tatsuo
Author_Institution :
Cascade Microtech Inc., Beaverton, OR, USA
fDate :
9/1/1995 12:00:00 AM
Abstract :
The appearance of Hopf bifurcation in a microwave doubler is due to the relative speed of the recombination delay of the junction diode with the input RF signal, which results in a dynamical negative resistance. This is verified here experimentally by using a back-to-back diode structure that quenches Hopf bifurcation numerically through stability analysis in the frequency domain
Keywords :
bifurcation; chaos; circuit stability; frequency multipliers; frequency-domain analysis; microwave diodes; microwave frequency convertors; negative resistance; nonlinear network analysis; Hopf bifurcation; back-to-back diode structure; dynamical negative resistance; frequency domain; input RF signal; junction diode; microwave doubler; recombination delay; stability analysis; Bifurcation; Chaos; Delay; Diodes; Electric breakdown; Frequency; Harmonic analysis; Microwave devices; Stability analysis; Voltage;
Journal_Title :
Microwave and Guided Wave Letters, IEEE
