Title :
Universal Tests for Detection of Input/Output Stuck-At and Bridging Faults
Author_Institution :
Department of Computer Science, School of Advanced Technology, State University of New York
Abstract :
In this correspondence we present universal tests for detection of single and multiple stuck-at and bridging faults in combinational and sequential networks.
Keywords :
Asymptotically optimal tests; fault detection; stuck-at and bridging faults; universal tests; upper and lower bounds for number of tests; Circuit faults; Computer errors; Error correction codes; Fault detection; Hamming distance; Output feedback; Testing; Upper bound; Asymptotically optimal tests; fault detection; stuck-at and bridging faults; universal tests; upper and lower bounds for number of tests;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1983.1676182
